The digital method of surface reflectance coefficient measurement

by Ivanchenko I. A., Santoniy V. I., Smyntyna V. A.
Published 2010-06-01

Plastic deformation in nanostructure silicon formation

by Smyntyna V. A., Kulinich O. A., Yatsunkiy I. R.
Published 2011-04-01

The influence of initial defects on mechanical stress and deformation distribution in oxidized silicon

by Kulinich O. A., Smyntyna V. A., Glauberman M. A., Chemeresyuk G. G., Yatsunskiy I. R.
Published 2008-10-01

Influence of polycrystalline silicon layer on flow through «metal — p-Si» contact

by Smyntyna V. A., Kulinich O. A., Yatsunskii I. R., Sviridova O. V., Marchuk I. A.
Published 2011-11-01