A Novel Two-Axis Load Sensor Designed for in Situ Scratch Testing inside Scanning Electron Microscopes

by Chengli Shi, Hu Huang, Hongwei Zhao, Boda Wu, Shunguang Wan
Published 2013-02-01

Randomness and Statistical Laws of Indentation-Induced Pop-Out in Single Crystal Silicon

by Chunyang Geng, Shunguang Wan, Lin Zhang, Chengli Shi, Hongwei Zhao, Hu Huang
Published 2013-04-01

Design and Analysis of a Compact Precision Positioning Platform Integrating Strain Gauges and the Piezoactuator

by Shunguang Wan, Zhichao Ma, Chengli Shi, Zunqiang Fan, Zhaojun Yang, Hongwei Zhao, Hu Huang
Published 2012-07-01

A novel and compact nanoindentation device for in situ nanoindentation tests inside the scanning electron microscope

by Hu Huang, Hongwei Zhao, Jie Mi, Jie Yang, Shunguang Wan, Lixia Xu, Zhichao Ma
Published 2012-03-01

Effect of residual chips on the material removal process of the bulk metallic glass studied by in situ scratch testing inside the scanning electron microscope

by Hu Huang, Hongwei Zhao, Chengli Shi, Boda Wu, Zunqiang Fan, Shunguang Wan, Chunyang Geng
Published 2012-12-01