A Combined Method for Predicting the Boron Deposited Mass and the CIPS Risk

by Shengzhe Li, Dongmei Yang, Tengfei Zhang, Xiaojing Liu
Published 2019-01-01

Micro-/nano-voids guided two-stage film cracking on bioinspired assemblies for high-performance electronics

by Weining Miao, Yuxing Yao, Zhiwei Zhang, Chunping Ma, Shengzhe Li, Jiayue Tang, He Liu, Zemin Liu, Dianyu Wang, Michael A. Camburn, Jen-Chun Fang, Ruiran Hao, Xinyu Fang, Shuang Zheng, Nan Hu, Xiaoguang Wang
Published 2019-08-01