Substrate Temperature Dependent Properties of Sputtered AlN:Er Thin Film for In-Situ Luminescence Sensing of Al/AlN Multilayer Coating Health

by Liping Fang, Yidong Jiang, Shengfa Zhu, Jingjing Ding, Dongxu Zhang, Anyi Yin, Piheng Chen
Published 2018-11-01

Fretting Wear Behavior and Photoelectron Spectroscopy (XPS) Analysis of a Ti/TiN Multilayer Film Deposited on Depleted Uranium

by Shengfa Zhu, Yanping Wu, Zhengyang Li, Liping Fang, Anyi Yin, Jiawei Yan, Fan Jiang, Xiandong Meng, Piheng Chen, Zhenbing Cai
Published 2018-08-01