Infrared birefringence imaging of residual stress and bulk defects in multicrystalline silicon

by Ganapati, Vidya, Schoenfelder, Stephan, Castellanos, Sergio, Oener, Sebastian, Koepge, Ringo, Sampson, Aaron, Marcus, Matthew A., Lai, Barry, Morhenn, Humphrey, Hahn, Giso, Bagdahn, Joerg, Buonassisi, Tonio
Published 2013