Comphy v3.0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices

by Claes, D., Franco, J., Grasser, T., Grill, A., Kaczer, B., Karl, A., Knobloch, T., Michl, J., Rzepa, G., Schleich, C., Waldhoer, D., Waltl, M.
Published 2023