Investigation of properties of nitride and silicon oxide films grown by plasma-chemical deposition on a silicon substrate

by Rubtsevich I. I., Solovyov Ya. A., Vysotskiy V. B., Dudkin A. I., Kovalchuk N. S.
Published 2011-08-01

Improving the reliability of Schottky diodes under the influence of electrostatic discharges

by Sоlоdukha V. A., Turtsevich A. S., Solov’yov J. A., Rubtsevich I. I., Kerentsev A. F.
Published 2012-10-01

The investigation of quality of power-transistor crystals soldering by a transient impedance-spectrometer

by Turtsevich А. S., Rubtsevich I. I., Solov’yov Ya. А., Vas’kov O. S., Kononenko V. К., Niss V. S., Kerentsev А. F.
Published 2012-10-01