Genetic analysis of loose smut (Ustilago tritici) resistance in Sonop spring wheat

by Dinushika Thambugala, Jim G. Menzies, Ron E. Knox, Heather L. Campbell, Curt A. McCartney
Published 2020-07-01

Single Marker and Haplotype-Based Association Analysis of Semolina and Pasta Colour in Elite Durum Wheat Breeding Lines Using a High-Density Consensus Map.

by Amidou N'Diaye, Jemanesh K Haile, Aron T Cory, Fran R Clarke, John M Clarke, Ron E Knox, Curtis J Pozniak
Published 2017-01-01

Correction: Single Marker and Haplotype-Based Association Analysis of Semolina and Pasta Colour in Elite Durum Wheat Breeding Lines Using a High-Density Consensus Map.

by Amidou N'Diaye, Jemanesh K Haile, Aron T Cory, Fran R Clarke, John M Clarke, Ron E Knox, Curtis J Pozniak
Published 2017-01-01

Evaluation of variant calling tools for large plant genome re-sequencing

by Zhen Yao, Frank M. You, Amidou N’Diaye, Ron E. Knox, Curt McCartney, Colin W. Hiebert, Curtis Pozniak, Wayne Xu
Published 2020-08-01

Weighted gene co-expression network analysis unveils gene networks associated with the Fusarium head blight resistance in tetraploid wheat

by Ehsan Sari, Adrian L. Cabral, Brittany Polley, Yifang Tan, Emma Hsueh, David J. Konkin, Ron E. Knox, Yuefeng Ruan, Pierre R. Fobert
Published 2019-12-01

High Density Mapping of Quantitative Trait Loci Conferring Gluten Strength in Canadian Durum Wheat

by Yuefeng Ruan, Bianyun Yu, Ron E. Knox, Asheesh K. Singh, Ron DePauw, Richard Cuthbert, Wentao Zhang, Isabelle Piche, Peng Gao, Andrew Sharpe, Pierre Fobert
Published 2020-03-01

Conditional Mapping Identified Quantitative Trait Loci for Grain Protein Concentration Expressing Independently of Grain Yield in Canadian Durum Wheat

by Yuefeng Ruan, Bianyun Yu, Ron E. Knox, Wentao Zhang, Asheesh K. Singh, Richard Cuthbert, Pierre Fobert, Ron DePauw, Samia Berraies, Andrew Sharpe, Bin Xiao Fu, Jatinder Sangha
Published 2021-03-01

Characterization of the Genetic Architecture for Fusarium Head Blight Resistance in Durum Wheat: The Complex Association of Resistance, Flowering Time, and Height Genes

by Yuefeng Ruan, Wentao Zhang, Ron E. Knox, Samia Berraies, Heather L. Campbell, Raja Ragupathy, Kerry Boyle, Brittany Polley, Maria Antonia Henriquez, Andrew Burt, Santosh Kumar, Richard D. Cuthbert, Pierre R. Fobert, Hermann Buerstmayr, Ron M. DePauw, Ron M. DePauw
Published 2020-12-01

High-density genetic mapping of a major QTL for resistance to multiple races of loose smut in a tetraploid wheat cross.

by Sachin Kumar, Ron E Knox, Asheesh K Singh, Ron M DePauw, Heather L Campbell, Julio Isidro-Sanchez, Fran R Clarke, Curtis J Pozniak, Amidou N'Daye, Brad Meyer, Andrew Sharpe, Yuefeng Ruan, Richard D Cuthbert, Daryl Somers, George Fedak
Published 2018-01-01

High density mapping and haplotype analysis of the major stem-solidness locus SSt1 in durum and common wheat.

by Kirby T Nilsen, Amidou N'Diaye, P R MacLachlan, John M Clarke, Yuefeng Ruan, Richard D Cuthbert, Ron E Knox, Krystalee Wiebe, Aron T Cory, Sean Walkowiak, Brian L Beres, Robert J Graf, Fran R Clarke, Andrew G Sharpe, Assaf Distelfeld, Curtis J Pozniak
Published 2017-01-01

Mapping quantitative trait loci associated with leaf rust resistance in five spring wheat populations using single nucleotide polymorphism markers.

by Firdissa E Bokore, Ron E Knox, Richard D Cuthbert, Curtis J Pozniak, Brent D McCallum, Amidou N'Diaye, Ron M DePauw, Heather L Campbell, Catherine Munro, Arti Singh, Colin W Hiebert, Curt A McCartney, Andrew G Sharpe, Asheesh K Singh, Dean Spaner, D B Fowler, Yuefeng Ruan, Samia Berraies, Brad Meyer
Published 2020-01-01

High density genetic mapping of Fusarium head blight resistance QTL in tetraploid wheat.

by Ehsan Sari, Samia Berraies, Ron E Knox, Asheesh K Singh, Yuefeng Ruan, Richard D Cuthbert, Curtis J Pozniak, Maria Antonia Henriquez, Santosh Kumar, Andrew J Burt, Amidou N'Diaye, David J Konkin, Adrian L Cabral, Heather L Campbell, Krystalee Wiebe, Janet Condie, Prabhath Lokuruge, Brad Meyer, George Fedak, Fran R Clarke, John M Clarke, Daryl J Somers, Pierre R Fobert
Published 2018-01-01