Increased Duration of Heating Boosts Local Drug Deposition during Radiofrequency Ablation in Combination with Thermally Sensitive Liposomes (ThermoDox) in a Porcine Model.

by Christine E Swenson, Dieter Haemmerich, Donald H Maul, Bridget Knox, Nicole Ehrhart, Robert A Reed
Published 2015-01-01

Failure Estimates for SiC Power MOSFETs in Space Electronics

by Kenneth F. Galloway, Arthur F. Witulski, Ronald D. Schrimpf, Andrew L. Sternberg, Dennis R. Ball, Arto Javanainen, Robert A. Reed, Brian D. Sierawski, Jean-Marie Lauenstein
Published 2018-06-01

Machine-Learning vs. Expert-Opinion Driven Logistic Regression Modelling for Predicting 30-Day Unplanned Rehospitalisation in Preterm Babies: A Prospective, Population-Based Study...

by Robert A. Reed, Andrei S. Morgan, Andrei S. Morgan, Andrei S. Morgan, Jennifer Zeitlin, Pierre-Henri Jarreau, Pierre-Henri Jarreau, Héloïse Torchin, Héloïse Torchin, Véronique Pierrat, Véronique Pierrat, Pierre-Yves Ancel, Pierre-Yves Ancel, Babak Khoshnood
Published 2021-02-01

Bulk Silicon-Germanium Heterojunction Bipolar Transistor Process Feature Implications for Single-Event Effects Analysis and Charge Collection Mechanisms

by Pellish, Jonathan Allen
Published 2008

Radiation-Induced Energy Deposition and Single Event Upset Error Rates in Scaled Microelectronic Structures

by Howe, Christina L
Published 2005

EFFICIENT CHARACTERIZATION OF TRANSIENT PULSE SHAPES FROM RADIATION INDUCED UPSETS.

by Bennett, William Geoffrey
Published 2012

A GENERALIZED SINGLE-EVENT ANALYSIS AND HARDENING OPTIONS FOR MIXED-SIGNAL PHASE-LOCKED LOOP CIRCUITS

by Loveless, Thomas Daniel
Published 2009

Single-Event Mechanisms in InAlSb/InAs/AlGaSb High Electron Mobility Transistors

by Ramachandran, Vishwanath
Published 2013

CHARGE COLLECTION MECHANISMS IN AlGaN/GaN MOS HIGH ELECTRON MOBILITY TRANSISTORS

by Samsel, Isaak Knox
Published 2014

Energetic electron-induced single event upsets in static random access memory

by King, Michael Patrick
Published 2014

Charge Collection Mechanisms in Silicon Devices During High-Level Carrier Generation Events

by Hooten, Nicholas C
Published 2014

A TECHNIQUE FOR PREDICTING THE MUON INDUCED UPSET CROSS SECTION IN SUBMICRON MOS DEVICES USING PROTON TESTS AND SIMULATION

by Trippe, James Michael
Published 2014

X-ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices

by Wang, Pengfei
Published 2017

SIMULATED TEMPERATURE DEPENDENCY OF SEU SENSITIVITY IN A 0.5 ìm CMOS SRAM

by Sanathanamurthy, Siddartha
Published 2008

UPSET TRENDS IN FLIP-FLOP DESIGNS AT DEEP SUBMICRON TECHNOLOGIES

by Benakanakere Sheshadri, Vijay
Published 2010