Patterns of Reliability: Assessing the Reproducibility and Integrity of DNA Methylation Measurement

by Karen Sugden, Eilis J. Hannon, Louise Arseneault, Daniel W. Belsky, David L. Corcoran, Helen L. Fisher, Renate M. Houts, Radhika Kandaswamy, Terrie E. Moffitt, Richie Poulton, Joseph A. Prinz, Line J.H. Rasmussen, Benjamin S. Williams, Chloe C.Y. Wong, Jonathan Mill, Avshalom Caspi
Published 2020-05-01