Discrimination of Aluminum from Silicon by Electron Crystallography with the JUNGFRAU Detector

by Erik Fröjdh, Julian T. C. Wennmacher, Przemyslaw Rzepka, Aldo Mozzanica, Sophie Redford, Bernd Schmitt, Jeroen A. van Bokhoven, Tim Gruene
Published 2020-12-01

The dynamics of overlayer formation on catalyst nanoparticles and strong metal-support interaction

by Arik Beck, Xing Huang, Luca Artiglia, Maxim Zabilskiy, Xing Wang, Przemyslaw Rzepka, Dennis Palagin, Marc-Georg Willinger, Jeroen A. van Bokhoven
Published 2020-06-01