Dependence of static dielectric constant of silicon on resistivity at room temperature

by Ristić Stojan, Prijić Aneta, Prijić Zoran
Published 2004-01-01

Temperature and yield stress characterization of electric contacts by 3D numerical simulation

by Prijić Aneta, Pešić Biljana, Prijić Zoran, Pantić Dragan, Pavlović Zoran
Published 2005-01-01

Modeling and PSPICE simulation of NBTI effects in VDMOS transistors

by Marjanović Miloš, Danković Danijel, Prijić Aneta, Prijić Zoran, Janković Nebojša, Davidović Vojkan
Published 2015-01-01