Improved method for detection of “hot spots” in microelectronic devices

by Popov V. M., Klimenko A. S., Pokanevich A. P.
Published 2008-06-01

Method of determination of temperature and heat resistance of the points on the integrated circuit crystal surface

by Popov V. M., Klimenko A. S., Pokanevich A. P., Samotovka V. L.
Published 2011-12-01

The mercury microprobe for investigation of local electrophysical properties of semiconductor structures

by Popov V. M., Klimenko A. S., Pokanevich A. P., Shustov Y. M.
Published 2010-02-01

The influence of low energy argon ion irradiation on generation of electrically active defects in silicon

by Popov V. M., Shustov Y. M., Klimenko A. S., Pokanevich A. P.
Published 2009-08-01

Investigation of local electrophysical properties of electrically active defects in silicon-based solar cells

by Popov V. M., Klimenko A. S., Pokanevich A. P., Shustov Y. M., Gavrilyuk I. I., Panin A. I.
Published 2010-08-01

The photodiode of UV-range on the basis of ZnSe

by Perevertailo V. L., Dobrovol’skiy Yu. G., Popov V. M., Pokanevich A. P., Matskevich V. M., Pizhikov V. D., Shabashkevich B. G., Yur’yev V. G.
Published 2010-03-01