Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling

by Rajkiran Tholapi, Manon Gallard, Nelly Burle, Christophe Guichet, Stephanie Escoubas, Magali Putero, Cristian Mocuta, Marie-Ingrid Richard, Rebecca Chahine, Chiara Sabbione, Mathieu Bernard, Leila Fellouh, Pierre Noé, Olivier Thomas
Published 2020-06-01