Features of the model of main information failures in digital CMOS VLSI at impact of the radiation

by Vyacheslav M. Barbashov, Nikolai S. Trushkin
Published 2018-03-01

Experiment-Calculated Estimate of a LSIC Operation Reliability in order to Ensure Safety of Information under Radiation Influence

by Vyacheslav Mihailovich Barbashov, Vitaly Grigorievich Ivanenko, Nikolai Sergeievich Trushkin
Published 2015-03-01