A Computationally Efficient Compact Model for Trap-Assisted Carrier Transport Through Multi-Stack Gate Dielectrics of HKMG nMOS Transistors

by Apoorva Ojha, Nihar R. Mohapatra
Published 2018-01-01

A Zero-Cost Technique to Improve ON-State Performance and Reliability of Power LDMOS Transistors

by Kumari Neeraj Kaushal, Nihar R. Mohapatra
Published 2021-01-01

A Channel Stress-Profile-Based Compact Model for Threshold Voltage Prediction of Uniaxial Strained HKMG nMOS Transistors

by Apoorva Ojha, Yogesh S. Chauhan, Nihar R. Mohapatra
Published 2016-01-01

Leaky Integrate and Fire Neuron by Charge-Discharge Dynamics in Floating-Body MOSFET

by Sangya Dutta, Vinay Kumar, Aditya Shukla, Nihar R. Mohapatra, Udayan Ganguly
Published 2017-08-01

Insights into the Mechanical and Electrical Properties of a Metal–Phosphorene Interface: An Ab Initio Study with a Wide Range of Metals

by Abdul Ghaffar, Mohit D. Ganeriwala, Kenta Hongo, Ryo Maezono, Nihar R. Mohapatra
Published 2021-03-01

Modeling of Charge and Quantum Capacitance in Low Effective Mass III-V FinFETs

by Mohit D. Ganeriwala, Chandan Yadav, Nihar R. Mohapatra, Sourabh Khandelwal, Chenming Hu, Yogesh Singh Chauhan
Published 2016-01-01

Analog Performance and its Variability in Sub-10 nm Fin-Width FinFETs: a Detailed Analysis

by Mandar S. Bhoir, Thomas Chiarella, Lars Ake Ragnarsson, Jerome Mitard, Valentina Terzeiva, Naoto Horiguchi, Nihar R. Mohapatra
Published 2019-01-01