Degradation of vertical GaN-on-GaN fin transistors: Step-stress and constant voltage experiments

by Ruzzarin, M., Meneghini, M., De Santi, C., Sun, Min, Palacios, Tomas, Meneghesso, G., Zanoni, E.
Published 2019

Logarithmic trapping and detrapping in β-Ga2O3MOSFETs: Experimental analysis and modeling

by Brusaterra, E., De Santi, C., Fregolent, M., Meneghesso, G., Meneghini, M., Tetzner, K., Würfl, J., Zanoni, E.
Published 2022