Trigger-When-Charged: A Technique for Directly Measuring RTN and BTI-Induced Threshold Voltage Fluctuation Under Use-V-dd

by Asenov, A, Gao, R, Ji, ZG, Kaczer, B, Manut, A, Mehedi, M, Vigar, D, Zhang, JF, Zhang, WD
Published 2019

Trigger-When-Charged: A technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-V dd

by Asenov, A., Gao, R., Ji, Z., Kaczer, B., Manut, A., Mehedi, M., Vigar, D., Zhang, J.F, Zhang, W.D
Published 2019