Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride

by Victor Tkachenko, Vladimir Lipp, Martin Büscher, Flavio Capotondi, Hauke Höppner, Nikita Medvedev, Emanuele Pedersoli, Mark J. Prandolini, Giulio M. Rossi, Franz Tavella, Sven Toleikis, Matthew Windeler, Beata Ziaja, Ulrich Teubner
Published 2021-03-01