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Markus Hellenbrand
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A Method for Determining Trap Distributions of Specific Channel Surfaces in InGaAs Tri-Gate MOSFETs
by
Seiko Netsu
,
Markus
Hellenbrand
,
Cezar B. Zota
,
Yasuyuki Miyamoto
,
Erik Lind
Published 2018-01-01
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