Profillinie 1: Neue Materialien und neue Werkstoffe

by Hoyer, Walter, Richter, Frank, Goedel, Werner A., Köhler, Eberhard, Wielage, Bernhard, Spange, Stefan, Hietschold, Michael, Radehaus, Christian, von Borczyskowski, Christian, Schreiber, Michael, Magerle, Robert, Häussler, Peter, Solbrig, Heinrich, Lang, Heinrich, Cichos, Frank
Published 2005

Profillinie 1: Neue Materialien und neue Werkstoffe:

by Hoyer, Walter, Richter, Frank, Goedel, Werner A., Köhler, Eberhard, Wielage, Bernhard, Spange, Stefan, Hietschold, Michael, Radehaus, Christian, von Borczyskowski, Christian, Schreiber, Michael, Magerle, Robert, Häussler, Peter, Solbrig, Heinrich, Lang, Heinrich, Cichos, Frank
Published 2005

Registration and Quantitative Image Analysis of SPM Data

by Rehse, Sabine
Published 2008

Nanoscale Imaging of Mechanical Properties of Polymeric Materials Using Nanotomography and Scanning Force Microscopy Based Methods

by Dietz, Christian
Published 2008