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1by Telford J J., Carr-Locke D L., Baron T H., Poneros J M., Bounds B C., Kelsey P B., Schapiro R H., Huang C S., Lichtenstein D R., Jacobson B C., Saltzman J R., Thompson C C., Forcione D G., Gostout C J., Brugge W R.Get full text
Published 2011-01-01
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2by Abu Dayyeh, B.K, Bhatt, A., Bhutani, M.S, Bucobo, J.C, Chandrasekhara, V., Copland, A.P, Jirapinyo, P., Krishnan, K., Kumta, N.A, Law, R.J, Lichtenstein, D.R, Maple, J.T, Melson, J., Pannala, R., Parsi, M.A, Rahimi, E.F, Saumoy, M., Sethi, A., Trikudanathan, G., Trindade, A.J, Vela, M.F, Watson, R.R, Yang, J.View Fulltext in Publisher
Published 2022
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3by (ASGE Technology Committee Chair), Abu Dayyeh, B.K, Bhatt, A., Bhutani, M.S, Bucobo, J.C, Chandrasekhara, V., Copland, A.P, Jirapinyo, P., Krishnan, K., Kumta, N.A, Law, R.J, Lichtenstein, D.R, Maple, J.T, Melson, J., Pannala, R., Parsi, M.A, Rahimi, E.F, Saumoy, M., Sethi, A., Trikudanathan, G., Trindade, A.J, Vela, M.F, Watson, R.R, Yang, J.View Fulltext in Publisher
Published 2022
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