Showing 1 - 2 results of 2 for search 'LUO, TSENG-CHIN', query time: 0.11s Refine Results
  1. 1
    The comparision of the Criteria of Patent Examining Procedure between Taiwan and the U.S.
    by LUO, TSENG-CHIN, 駱增進
    Published 1997
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  2. 2
    EDA and Testing Methodologies for Characterization and Minimization of Process Variation on Advanced CMOS Technology Nodes
    by Luo, Tseng-Chin, 羅增錦
    Published 2012
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