Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young's experiment

by Ichiro Inoue, Kensuke Tono, Yasumasa Joti, Takashi Kameshima, Kanade Ogawa, Yuya Shinohara, Yoshiyuki Amemiya, Makina Yabashi
Published 2015-11-01

A beam branching method for timing and spectral characterization of hard X-ray free-electron lasers

by Tetsuo Katayama, Shigeki Owada, Tadashi Togashi, Kanade Ogawa, Petri Karvinen, Ismo Vartiainen, Anni Eronen, Christian David, Takahiro Sato, Kyo Nakajima, Yasumasa Joti, Hirokatsu Yumoto, Haruhiko Ohashi, Makina Yabashi
Published 2016-05-01

Dynamics of the photoinduced insulator-to-metal transition in a nickelate film

by Vincent Esposito, Laurenz Rettig, Elisabeth M. Bothschafter, Yunpei Deng, Christian Dornes, Lucas Huber, Tim Huber, Gerhard Ingold, Yuichi Inubushi, Tetsuo Katayama, Tomoya Kawaguchi, Henrik Lemke, Kanade Ogawa, Shigeki Owada, Milan Radovic, Mahesh Ramakrishnan, Zoran Ristic, Valerio Scagnoli, Yoshikazu Tanaka, Tadashi Togashi, Kensuke Tono, Ivan Usov, Yoav W. Windsor, Makina Yabashi, Steven L. Johnson, Paul Beaud, Urs Staub
Published 2018-11-01

Real-time observation of X-ray-induced intramolecular and interatomic electronic decay in CH2I2

by Hironobu Fukuzawa, Tsukasa Takanashi, Edwin Kukk, Koji Motomura, Shin-ichi Wada, Kiyonobu Nagaya, Yuta Ito, Toshiyuki Nishiyama, Christophe Nicolas, Yoshiaki Kumagai, Denys Iablonskyi, Subhendu Mondal, Tetsuya Tachibana, Daehyun You, Syuhei Yamada, Yuta Sakakibara, Kazuki Asa, Yuhiro Sato, Tsukasa Sakai, Kenji Matsunami, Takayuki Umemoto, Kango Kariyazono, Shinji Kajimoto, Hikaru Sotome, Per Johnsson, Markus S. Schöffler, Gregor Kastirke, Kuno Kooser, Xiao-Jing Liu, Theodor Asavei, Liviu Neagu, Serguei Molodtsov, Kohei Ochiai, Manabu Kanno, Kaoru Yamazaki, Shigeki Owada, Kanade Ogawa, Tetsuo Katayama, Tadashi Togashi, Kensuke Tono, Makina Yabashi, Aryya Ghosh, Kirill Gokhberg, Lorenz S. Cederbaum, Alexander I. Kuleff, Hiroshi Fukumura, Naoki Kishimoto, Artem Rudenko, Catalin Miron, Hirohiko Kono, Kiyoshi Ueda
Published 2019-05-01