Assessment of mixed-layer height estimation from single-wavelength ceilometer profiles

by T. N. Knepp, T. N. Knepp, J. J. Szykman, J. J. Szykman, R. Long, R. M. Duvall, J. Krug, M. Beaver, K. Cavender, K. Kronmiller, M. Wheeler, R. Delgado, R. Hoff, T. Berkoff, E. Olson, R. Clark, D. Wolfe, D. Van Gilst, D. Neil
Published 2017-10-01