Time-of-flight secondary ion mass spectrometry fragment regularity in gallium-doped zinc oxide thin films

by K. G. Saw, S. R. Esa
Published 2021-04-01

New Insights on the Burstein-Moss Shift and Band Gap Narrowing in Indium-Doped Zinc Oxide Thin Films.

by K G Saw, N M Aznan, F K Yam, S S Ng, S Y Pung
Published 2015-01-01

Atmospheric pressure chemical vapor deposition of indium oxide nanostructured films for photoelectrochemical application

by T.M. Aper, F.K. Yam, K.G. Saw, Khi Poay Beh, Khaled M. Chahrour
Published 2021-05-01