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Jun Myungsim
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Jun Myungsim
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The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured by CMOS Compatible Process
by
Choi Sung-Jin
,
Jang Moongyu
,
Park Youngsam
,
Jun
Myungsim
,
Hyun Younghoon
,
Zyung Taehyoung
Published 2010-01-01
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