Elastic and thermal properties of free-standing molybdenum disulfide membranes measured using ultrafast transient grating spectroscopy

by Taeyong Kim, Ding Ding, Jong-Hyuk Yim, Young-Dahl Jho, Austin J. Minnich
Published 2017-08-01

Rapid 3D-Imaging of Semiconductor Chips Using THz Time-of-Flight Technique

by Jong Hyuk Yim, Su-yeon Kim, Yiseob Kim, Suyoung Cho, Jangsun Kim, Yeong Hwan Ahn
Published 2021-05-01