Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy

by Jeremiah Croshaw, Thomas Dienel, Taleana Huff, Robert Wolkow
Published 2020-09-01

Lithography for robust and editable atomic-scale silicon devices and memories

by Roshan Achal, Mohammad Rashidi, Jeremiah Croshaw, David Churchill, Marco Taucer, Taleana Huff, Martin Cloutier, Jason Pitters, Robert A. Wolkow
Published 2018-07-01