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Jean-Yves Rosaye
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Jean-Yves Rosaye
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Characterization of Defect Traps in SiO2 Thin Films
by
Jean
-
Yves
Rosaye
,
Pierre Mialhe
,
Jean-Pierre Charles
,
Mitsuo Sakashita
,
Hiroya Ikeda
,
Akira Sakai
,
Shigeaki Zaima
,
Yukio Yasuda
Published 2001-01-01
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