Verorten, verkörpern, verunsichern

by J. Hagmann
Published 2014-04-01

Analysis and equivalent circuit for accurate wideband calculations of the impedance for a piezoelectric transducer having loss

by M. J. Hagmann
Published 2019-08-01

Scanning frequency comb microscopy—A new method in scanning probe microscopy

by M. J. Hagmann
Published 2018-12-01

Simulation of sub-nm carrier profiling by scanning frequency comb microscopy

by M. J. Hagmann, J. Wiedemeier
Published 2019-05-01

Application of transient pulses on power supply cables by using commercial of the shelf components

by J. Hagmann, L.-O. Fichte, S. Dickmann, M. Schaarschmidt, S. Potthast
Published 2010-10-01