Showing 1 - 2 results of 2 for search 'Huth, M.', query time: 0.16s Refine Results
  1. 1
    Mapping the values of IoT
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  2. 2
    Identifying the crossover between growth regimes via in-situ conductance measurements in focused electron beam induced deposition
    by Winhold M., Weirich P. M., Schwalb C. H., Huth M.
    Published 2014-12-01
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    Article
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