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Hsin-feng Hsieh
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Hsin-feng Hsieh
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Hsin-feng Hsieh
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1
High density plasma used in high sensitivity etching of aluminum inner connection structure with 0.22 micrometer CD of 12 inches wafer
by
Hsin
-
feng
Hsieh
,
謝欣峰
Published 2007
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2
Study of Chip-Level EMI Based on Near-Field Measurement Techniques
by
Hsin
-
Feng
Hsieh
,
謝昕峯
Published 2012
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