Simultaneous On-State Voltage and Bond-Wire Resistance Monitoring of Silicon Carbide MOSFETs

by Nick Baker, Haoze Luo, Francesco Iannuzzo
Published 2017-03-01

Non-Contact Degradation Evaluation for IGBT Modules Using Eddy Current Pulsed Thermography Approach

by Xingliang Liu, Guiyun Tian, Yu Chen, Haoze Luo, Jian Zhang, Wuhua Li
Published 2020-05-01

A 3D Thermal Network Model for Monitoring Imbalanced Thermal Distribution of Press-Pack IGBT Modules in MMC-HVDC Applications

by Yao Chang, Wuhua Li, Haoze Luo, Xiangning He, Francesco Iannuzzo, Frede Blaabjerg, Weixing Lin
Published 2019-04-01

A Statistical Submodule Open-Circuit Failure Diagnosis Method for Modular Multilevel Converters (MMCs) With Variance Measurement

by Heya Yang, Weihao Zhou, Jing Sheng, Haoze Luo, Chushan Li, Wuhua Li, Xiangning He
Published 2020-01-01