Imaging shape and strain in nanoscale engineered semiconductors for photonics by coherent x-ray diffraction

by Felisa Berenguer, Giorgio Pettinari, Marco Felici, Nilanthy Balakrishnan, Jesse N. Clark, Sylvain Ravy, Amalia Patané, Antonio Polimeni, Gianluca Ciatto
Published 2020-04-01