Utilizing the Switching Stochasticity of HfO2/TiOx-Based ReRAM Devices and the Concept of Multiple Device Synapses for the Classification of Overlapping and Noisy Patterns

by Christopher Bengel, Felix Cüppers, Melika Payvand, Regina Dittmann, Rainer Waser, Rainer Waser, Susanne Hoffmann-Eifert, Stephan Menzel
Published 2021-06-01