Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction

by Kien Nguyen, Ewen Bellec, Edoardo Zatterin, Gwenael Le Rhun, Patrice Gergaud, Nicolas Vaxelaire
Published 2021-08-01

A convolutional neural network for defect classification in Bragg coherent X-ray diffraction

by Bruce Lim, Ewen Bellec, Maxime Dupraz, Steven Leake, Andrea Resta, Alessandro Coati, Michael Sprung, Ehud Almog, Eugen Rabkin, Tobias Schulli, Marie-Ingrid Richard
Published 2021-07-01