Applications of Direct-Current Current–Voltage Method to Total Ionizing Dose Radiation Characterization in SOI NMOSFETs with Different Process Conditions

by Yangyang Li, Chuanbin Zeng, Xiaojing Li, Linchun Gao, Weiwei Yan, Duoli Li, Yi Zhang, Zhengsheng Han, Jiajun Luo
Published 2021-04-01

Effect of Radiation on Interface Traps of SOI NMOSFETs by the Direct-Current Current-Voltage Technique

by Yangyang Li, Xiaojing Li, Bo Li, Linchun Gao, Weiwei Yan, Fangfang Wang, Duoli Li, Chuanbin Zeng, Jiajun Luo, Zhengsheng Han
Published 2019-01-01