Modeling of Carrier Trapping and Its Impact on Switching Performance

by Mitiko Miura-Mattausch, Hideyuki Kikuchihara, Tapas Kumar Maiti, Dondee Navarro, Hans Jurgen Mattausch
Published 2018-01-01

Leading-Edge Thin-Layer MOSFET Potential Modeling Toward Short-Channel Effect Suppression and Device Optimization

by Fernando Avila Herrera, Yoko Hirano, Takahiro Iizuka, Mitiko Miura-Mattausch, Hideyuki Kikuchihara, Dondee Navarro, Hans Jurgen Mattausch, Akira Ito
Published 2019-01-01