Noise performance of frequency modulation Kelvin force microscopy

by Heinrich Diesinger, Dominique Deresmes, Thierry Mélin
Published 2014-01-01

Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization

by Petr Polovodov, Didier Théron, Clément Lenoir, Dominique Deresmes, Sophie Eliet, Christophe Boyaval, Gilles Dambrine, Kamel Haddadi
Published 2021-03-01