Simulated exposure of titanium dioxide memristors to ion beams

by Marjanović Nada S., Vujisić Miloš Lj., Stanković Koviljka Đ., Despotović Dejan, Osmokrović Predrag V.
Published 2010-01-01

Uncertainty evaluation of the conducted emission measurements

by Kovačević Aleksandar M., Despotović Dejan D., Rajović Zoran A., Stanković Koviljka Đ., Kovačević Ana V., Kovačević Uroš D.
Published 2013-01-01