Imaging polarimetry for the determination of stress constraint in transparent solids

by De Martino A., Orlik X., Richert M.
Published 2010-06-01

Profile characterization of diffraction gratings using angle-resolved polarimetric measurements

by Ben Hatit S., Foucher J., Licitra C., De Martino A., Foldyna M.
Published 2010-06-01

Characterization of inclined GaSb nanopillars by angle resolved Mueller polarimetry

by Søndergård E., Le Roy S., De Martino A., Kildemo M., Foldyna M., Nerbø I.S.
Published 2010-06-01