In-situ NC-AFM measurements of high quality AlN(0001) layers grown at low growth rate on 4H-SiC(0001) and Si(111) substrates using ammonia molecular beam epitaxy

by Florian Chaumeton, Sébastien Gauthier, David Martrou
Published 2015-06-01

An NC-AFM and KPFM study of the adsorption of a triphenylene derivative on KBr(001)

by Antoine Hinaut, Adeline Pujol, Florian Chaumeton, David Martrou, André Gourdon, Sébastien Gauthier
Published 2012-03-01