Danger, high voltage! Using EEG and EOG measurements for cognitive overload detection in a simulated industrial context

by Bombeke, K., Cornillie, F., De Bruyne, J., De Marez, L., Durnez, W., Larmuseau, C., Morton, J., Raes, A., Saldien, J., Van Acker, B.B, Vanneste, P., Zheleva, A.
Published 2022