Environmental temperature effect on dimensional measurements of atomic force microscopy

by Chengfu Ma, Yuhang Chen, Wenhao Huang
Published 2021-06-01

Image contrast reversals in contact resonance atomic force microscopy

by Chengfu Ma, Yuhang Chen, Tian Wang
Published 2015-02-01

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

by Wenting Wang, Chengfu Ma, Yuhang Chen, Lei Zheng, Huarong Liu, Jiaru Chu
Published 2019-08-01