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Correction to: Test-retest reliability of the computer-assisted DIA-X-5 interview for mental disorders

by Jana Hoyer, Catharina Voss, Jens Strehle, John Venz, Lars Pieper, Hans-Ulrich Wittchen, Stefan Ehrlich, Katja Beesdo-Baum
Published 2020-07-01

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2

Test-retest reliability of the computer-assisted DIA-X-5 interview for mental disorders

by Jana Hoyer, Catharina Voss, Jens Strehle, John Venz, Lars Pieper, Hans-Ulrich Wittchen, Stefan Ehrlich, Katja Beesdo-Baum
Published 2020-06-01

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Article

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