Interpreting nanovoids in atom probe tomography data for accurate local compositional measurements

by Xing Wang, Constantinos Hatzoglou, Brian Sneed, Zhe Fan, Wei Guo, Ke Jin, Di Chen, Hongbin Bei, Yongqiang Wang, William J. Weber, Yanwen Zhang, Baptiste Gault, Karren L. More, Francois Vurpillot, Jonathan D. Poplawsky
Published 2020-02-01