Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis

by Ţălu Ştefan, Kulesza Slawomir, Bramowicz Miroslaw, Solaymani Shahram, Ţălu Mihai, Nezafat Negin Beryani, Rezaee Sahar
Published 2020-06-01