Showing 1 - 2 results of 2 for search 'Bodermann Bernd', query time: 0.05s Refine Results
  1. 1
    Characterization progress of a UV-microscope recently implemented at the PTB Nanometer Comparator for uni- and bidirectional measurements
    by Krüger Jan, Köning Rainer, Bodermann Bernd
    Published 2020-01-01
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    Article
  2. 2
    Imaging Mueller matrix ellipsometry setup for optical nanoform metrology
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    Article
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