Characterization of Vegard strain related to exceptionally fast Cu-chemical diffusion in Cu $$_2$$ 2 Mo $$_6$$ 6 S $$_8$$ 8 by an advanced electrochemical strain microscopy method

by Sebastian Badur, Diemo Renz, Marvin Cronau, Thomas Göddenhenrich, Dirk Dietzel, Bernhard Roling, André Schirmeisen
Published 2021-09-01